WE'RE HERE TO HELP

KB1256 - Sample Solaris fio Job Files

Published 11/10/2017 07:04 PM   |    Updated 11/30/2017 02:07 PM
This article is part of the ioMemory VSL Peak Performance Guide (click for a full list of articles in this guide).

These Windows test files are optimized for a specific test system. Optimal settings to test your system may vary depending on your system and target applications. For example, you may need to use a different ioengine; see the fio utility documentation for more information.

Data Destructive Tests
Write tests (including pre-conditioning) will write data to the device. These tests will write over all the data on the device. Only perform write tests on new or unused devices.
For every test,replace both instances of c*d0p0 with the particular device you wish to test.

To use these scripts/jobs:

  1. Download the .zip archive: Sample-Solaris-fio-Job-files.zip
  2. Unarchive the files.
  3. Replace c*d0p0 within the files with the particular device you wish to test.
    1. Where c*d0p0 is the master partition covering the entire raw block device.
  4. Follow the KB1252 - Peak Performance Testing Procedure